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Plastic deformation in silicon at room temperature as a mode for stacking fault formation

Plastic deformation in silicon at room temperature as a mode for stacking fault formation

Bibliographic Details
Main Author: Coppus, George Mitchell, 1953-
Language:en_US
Published: The University of Arizona. 1978
Subjects:
Semiconductors > Defects.
Semiconductor wafers.
Online Access:http://hdl.handle.net/10150/566680
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Internet

http://hdl.handle.net/10150/566680

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