MULTISTATE ANALOG AND DIGITAL INTEGRATED CIRCUITS

International Telemetering Conference Proceedings / October 09-11, 1973 / Sheraton Inn Northeast, Washington, D.C. === Several independent physical phenomena in unipolar and bipolar semiconductor pn junction devices and integrated structures lead to voltage and current-controlled negative resistan...

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Bibliographic Details
Main Author: Abraham, George
Other Authors: US Naval Research Laboratory
Language:en_US
Published: International Foundation for Telemetering 1973
Online Access:http://hdl.handle.net/10150/605427
http://arizona.openrepository.com/arizona/handle/10150/605427