Accelerated Life testing of Electronic Circuit Boards with Applications in Lead-Free Design

Accelerated Life testing of Electronic Circuit Boards with Applications in Lead-Free Design

abstract: This dissertation presents methods for addressing research problems that currently can only adequately be solved using Quality Reliability Engineering (QRE) approaches especially accelerated life testing (ALT) of electronic printed wiring boards with applications to avionics circuit boards...

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Bibliographic Details
Other Authors: Juarez, Joseph Moses (Author)
Format: Doctoral Thesis
Language:English
Published: 2012
Subjects:
Engineering
Statistics
Mechanical engineering
Accelerated testing
fatigue
Interconnect Stress test
Lead free
likelihood ratio test
vibration
Online Access:http://hdl.handle.net/2286/R.I.14570

Internet

http://hdl.handle.net/2286/R.I.14570

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