Structural characterization of II-VI and III-V compound semiconductor heterostructures and superlattices

Structural characterization of II-VI and III-V compound semiconductor heterostructures and superlattices

abstract: The research described in this dissertation has involved the use of transmission electron microcopy (TEM) to characterize the structural properties of II-VI and III-V compound semiconductor heterostructures and superlattices. The microstructure of thick ZnTe epilayers (~2.4 µm) grown by mo...

Full description

Bibliographic Details
Other Authors: Ouyang, Lu (Author)
Format: Doctoral Thesis
Language:English
Published: 2012
Subjects:
Materials Science
Physics
characterization
heterostructure
III-V
II-VI
superlattice
TEM
Online Access:http://hdl.handle.net/2286/R.I.14810

Internet

http://hdl.handle.net/2286/R.I.14810

Similar Items