Structural characterization of II-VI and III-V compound semiconductor heterostructures and superlattices
abstract: The research described in this dissertation has involved the use of transmission electron microcopy (TEM) to characterize the structural properties of II-VI and III-V compound semiconductor heterostructures and superlattices. The microstructure of thick ZnTe epilayers (~2.4 µm) grown by mo...
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Format: | Doctoral Thesis |
Language: | English |
Published: |
2012
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Online Access: | http://hdl.handle.net/2286/R.I.14810 |