Low Cost Analytical Techniques for Transceiver Characterization

Low Cost Analytical Techniques for Transceiver Characterization

abstract: Radio frequency (RF) transceivers require a disproportionately high effort in terms of test development time, test equipment cost, and test time. The relatively high test cost stems from two contributing factors. First, RF transceivers require the measurement of a diverse set of specificat...

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Bibliographic Details
Other Authors: Nassery, Afsaneh (Author)
Format: Doctoral Thesis
Language:English
Published: 2013
Subjects:
Electrical engineering
BiST
EVM Test
RF Test
Transceiver
Online Access:http://hdl.handle.net/2286/R.I.18810

Internet

http://hdl.handle.net/2286/R.I.18810

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