Methodical Design Approaches to Multiple Node Collection Robustness for Flip-Flop Soft Error MItigation

Methodical Design Approaches to Multiple Node Collection Robustness for Flip-Flop Soft Error MItigation

abstract: The space environment comprises cosmic ray particles, heavy ions and high energy electrons and protons. Microelectronic circuits used in space applications such as satellites and space stations are prone to upsets induced by these particles. With transistor dimensions shrinking due to cont...

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Bibliographic Details
Other Authors: Shambhulingaiah, Sandeep (Author)
Format: Doctoral Thesis
Language:English
Published: 2015
Subjects:
Electrical engineering
Flip-flop
Methodology
Multi node charge collection
Radiation hardening by design
Single Event Transient (SET)
Single Event Upset (SEU)
Online Access:http://hdl.handle.net/2286/R.I.29650

Internet

http://hdl.handle.net/2286/R.I.29650

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