SST SuperFlash Modeling and Simulation Under Ionizing Radiation
abstract: Flash memories are critical for embedded devices to operate properly but are susceptible to radiation effects, which make flash memory a key factor to improve the reliability of circuitry. This thesis describes the simulation techniques used to analyze and predict total ionizing dose (TID)...
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| Format: | Dissertation |
| Language: | English |
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2016
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| Online Access: | http://hdl.handle.net/2286/R.I.40254 |