Surface Potential Modelling of Hot Carrier Degradation in CMOS Technology
abstract: The scaling of transistors has numerous advantages such as increased memory density, less power consumption and better performance; but on the other hand, they also give rise to many reliability issues. One of the major reliability issue is the hot carrier injection and the effect it has o...
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| Format: | Dissertation |
| Language: | English |
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2017
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| Online Access: | http://hdl.handle.net/2286/R.I.44270 |