Monitor-Based In-Field Wearout Mitigation for CMOS RF Integrated Circuits
abstract: Performance failure due to aging is an increasing concern for RF circuits. While most aging studies are focused on the concept of mean-time-to-failure, for analog circuits, aging results in continuous degradation in performance before it causes catastrophic failures. In this regard, the li...
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| Format: | Doctoral Thesis |
| Language: | English |
| Published: |
2017
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| Online Access: | http://hdl.handle.net/2286/R.I.46353 |