Serial Femtosecond Crystallography Data Analysis of Photosystem II

Serial Femtosecond Crystallography Data Analysis of Photosystem II

abstract: Serial femtosecond crystallography (SFX) uses diffraction patterns from crystals delivered in a serial fashion to an X-Ray Free Electron Laser (XFEL) for structure determination. Typically, each diffraction pattern is a snapshot from a different crystal. SFX limits the effect of radiation...

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Bibliographic Details
Other Authors: Stander, Natasha (Author)
Format: Doctoral Thesis
Language:English
Published: 2019
Subjects:
Biochemistry
data analysis
photosystem II
serial femtosecond crystallography
x-ray free electron laser
Online Access:http://hdl.handle.net/2286/R.I.55497

Internet

http://hdl.handle.net/2286/R.I.55497

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