Transmission Electron Microscopy Characterization of Photovoltaic Semiconductor Materials

Transmission Electron Microscopy Characterization of Photovoltaic Semiconductor Materials

abstract: The research of this dissertation has primarily involved using transmission electron microscopy (TEM) techniques to study several semiconductor materials considered promising for future photovoltaic device applications. Layers of gallium phosphide (GaP) grown on silicon (Si) substrates w...

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Bibliographic Details
Other Authors: Boley, Allison (Author)
Format: Doctoral Thesis
Language:English
Published: 2020
Subjects:
Physics
electron microscopy
photovoltaic
semiconductor
TEM
Online Access:http://hdl.handle.net/2286/R.I.57106

Internet

http://hdl.handle.net/2286/R.I.57106

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