Defects and Defect Clusters in Compound Semiconductors

Defects and Defect Clusters in Compound Semiconductors

abstract: Extended crystal defects often play a critical role in determining semiconductor device performance. This dissertation describes the application of transmission electron microscopy (TEM) and aberration-corrected scanning TEM (AC-STEM) to study defect clusters and the atomic-scale structure...

Full description

Bibliographic Details
Other Authors: McKeon, Brandon (Author)
Format: Doctoral Thesis
Language:English
Published: 2020
Subjects:
Physics
Materials Science
Atomic Resolution
Compound Semiconductor
Defect Core Structure
Transmission Electron Microscopy
Online Access:http://hdl.handle.net/2286/R.I.57438

Internet

http://hdl.handle.net/2286/R.I.57438

Similar Items