Measurements and Simulations of Self-Heating in 40nm SOI MOSFETs
abstract: Combining the rapid development of semiconductor technologies, miniaturization of integrated circuits (ICs), and scaling down the device size is trending towards faster, cheaper, and more reliable components for low-power integrated circuits. Most research and development relate to efficie...
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| Format: | Doctoral Thesis |
| Language: | English |
| Published: |
2020
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| Online Access: | http://hdl.handle.net/2286/R.I.62949 |