UnSync: A Soft Error Resilient Redundant CMP Architecture
abstract: Reducing device dimensions, increasing transistor densities, and smaller timing windows, expose the vulnerability of processors to soft errors induced by charge carrying particles. Since these factors are inevitable in the advancement of processor technology, the industry has been forced t...
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| Format: | Dissertation |
| Language: | English |
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2011
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| Online Access: | http://hdl.handle.net/2286/R.I.8856 |