Analytical electron diffraction from III-V and II-VI semiconductors
This thesis describes the development and evaluation of a number of new TEM-based techniques for the measurement of composition in ternary III-V and II-VI semiconductors. New methods of polarity determination in binary and ternary compounds are also presented. The theory of high energy electron diff...
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University of Bristol
1990
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| Online Access: | https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.279764 |