The study of defects in bismuth germanium oxide (Biâ†1â†2GeOâ†2â†0) using phonon echoes and other techniques

Bibliographic Details
Main Author:	Terry, Ian
Published:	Lancaster University 1988
Subjects:	530.41 Semiconductor defects
Online Access:	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.290180

The study of defects in bismuth germanium oxide (Biâ†1â†2GeOâ†2â†0) using phonon echoes and other techniques