Structural defects in II-VI epitaxial layers
This study has principally been concerned with the structural assessment of a range of II-VI epitaxial layers using the combined techniques of cross-sectional transmission electron microscopy and microdiffraction. Iodine reactive ion sputtering has been used for the final stage of sample preparation...
| Main Author: | |
|---|---|
| Published: |
Durham University
1988
|
| Subjects: | |
| Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.327847 |