Single pattern detection and identification of of CMOS transistor faults, requirements and methods : design and realisation of the OCIMU Iâ†Dâ†Dâ†Q monitor; single pattern CMOS transistor fault testing

Bibliographic Details
Main Author:	Manhaeve, Hans A. R.
Published:	University of Hull 1996
Subjects:	621.31042 Components
Online Access:	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.361497

Single pattern detection and identification of of CMOS transistor faults, requirements and methods : design and realisation of the OCIMU Iâ†Dâ†Dâ†Q monitor; single pattern CMOS transistor fault testing