An assessment of dual-rail encoded on-line test methodologies and their impact on ASIC/FPGA design
The testing of fabricated Integrated Circuits (IC's) is of great concern to production engineers and circuit designers alike. With the complexity of Very Large Scale Integrated (VLSI) circuits increasing every year, the problem of testing the fabricated designs is becoming acute. Several method...
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Loughborough University
1997
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| Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.362754 |