Forward looking innovations in electronic speckle pattern interferometry (ESPI)

Electronic Speckle Pattern Interferometry (ESPI) dates from 1971. Attempts at commercial exploitation were unsuccessful; at the beginning of this decade it remained essentially a laboratory technique. Problems arose from the practical operation of the instrument and the nature of the output. Correla...

Full description

Bibliographic Details
Main Author: Montgomery, Paul C.
Published: Loughborough University 1987
Subjects:
535
Online Access:http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.376753