The chemical and magnetic structural characterisation of magneto-resistive devices using X-ray techniques

The academic and industrial interest in magnetic data storage has been fuelled by the information age. The number of applications for magnetic thin-films has increased rapidly, along with the popularity of using X-ray techniques as a tool by which to characterise them. Structural characterisation is...

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Bibliographic Details
Main Author: Buchanan, James David Ralph
Published: Durham University 2003
Subjects:
Online Access:http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.397577