Analysis of error functions in speckle shearing interferometry
Electronic Speckle Pattern Shearing Interferometry (ESPSI) or shearography has successfully been used in NDT for slope (δw/δx and/or δw/δy) measurement while strain measurement (δu/δx, δv/δy, δu/δy and δv/δx) is still under investigation This method is well accepted in industrial applications especi...
| Main Author: | |
|---|---|
| Published: |
Loughborough University
2001
|
| Subjects: | |
| Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.402963 |