Studies of dislocation geometries using high-resolution electron microscopy
Conventional strong-beam imaging techniques have been widely applied in the study of crystal defects, the main advantage being the high intensity of the images which reduces photographic exposure times to a few seconds at most, thus avoiding problems of drift and contamination. However, such images...
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University of Oxford
1975
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| Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.459528 |