X-ray diffraction topography : methods and applications
This thesis describes the application of the well established technique of X-ray diffraction topography to a variety of problems, and includes considerations of the optimum conditions for taking rapid topographs. Chapter I contains a brief review of the subject together with an indication of the ran...
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University of Oxford
1971
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| Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.474552 |