Grazing incidence X-ray scattering from magnetic thin films and nanostructures
Grazing incidence scattering of synchrotron x-rays has been used to characterize the structure of magnetic thin films and periodic nanostructures. The combined metal and metal oxide films have been chosen to clarify the effects of growth processing techniques in technologically important magnetic an...
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Durham University
2009
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| Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.511273 |