Characterizing the influence of neutron fields in causing single-event effects using portable detectors
The malfunction of semiconductor devices caused by cosmic rays is known as Single Event Effects(SEEs). In the atmosphere, secondary neutrons are the dominant particles causing this effect. The neutron flux density in atmosphere is very low. For a good statistical certainty, millions of device hours...
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University of Central Lancashire
2010
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| Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.546132 |