Characterisation and mitigation of long-term degradation effects in programmable logic
Reliability has always been an issue in silicon device engineering, but until now it has been managed by the carefully tuned fabrication process. In the future the underlying physical limitations of silicon-based electronics, plus the practical challenges of manufacturing with such complexity at suc...
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Imperial College London
2012
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| Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.550943 |