Measuring low dimensional Schottky barriers of rare earth silicide-silicon interfaces
The focus of this study is the measurement of low dimensional Schottky barrier heights of metal silicide-silicon interfaces and the challenges of current-voltage (I/V) curve interpretation. Engineering the Schottky barrier to exploit the spin and charge of an electron and manipulate it through silic...
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University of York
2011
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| Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.556337 |