Time-of-flight secondary ion mass spectrometry - fundamental issues for quantitative measurements and multivariate data analysis

Time-of-flight secondary ion mass spectrometry - fundamental issues for quantitative measurements and multivariate data analysis

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a powerful technique for the analysis of organic surfaces and interfaces for many innovative technologies. However, despite recent developments, there are still many issues and challenges hindering the robust, validated use of ToF-SIMS for...

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Bibliographic Details
Main Author: Lee, Joanna L. S.
Other Authors: Grovenor, Chris R. M. : Gilmore, Ian S.
Published: University of Oxford 2011
Subjects:
543.65
Mass spectrometry : Surface analysis : Microscopy and microanalysis : Nanostructures : Surfaces : secondary ion mass spectrometry : ToF-SIMS : instrumentation : topography : multivariate analysis : principal component analysis : sputtering : organic depth profiling : cluster ions
Online Access:http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.558532

Internet

http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.558532

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