Fault tolerance issues in nanoelectronics

The astonishing success story of microelectronics cannot go on indefinitely. In fact, once devices reach the few-atom scale (nanoelectronics), transient quantum effects are expected to impair their behaviour. Fault tolerant techniques will then be required. The aim of this thesis is to investigate t...

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Bibliographic Details
Main Author: Spagocci, S.
Published: University College London (University of London) 2008
Subjects:
500
Online Access:http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.564522