Fault tolerance issues in nanoelectronics

The astonishing success story of microelectronics cannot go on indefinitely. In fact, once devices reach the few-atom scale (nanoelectronics), transient quantum effects are expected to impair their behaviour. Fault tolerant techniques will then be required. The aim of this thesis is to investigate t...

Full description

Bibliographic Details
Main Author: Spagocci, S.
Published: University College London (University of London) 2008
Subjects:
500
Online Access:http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.564522

Similar Items