Redressing timing issues for speed-independent circuits in deep sub-micron age

With continued advancement in semiconductor manufacturing tech- nologies, process variations become more and more severe. These variations not only impair circuit performance but may also cause po- tential hazards in integrated circuits (IC). Asynchronous IC design, which does not rely on the use of...

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Bibliographic Details
Main Author: Li, Yu
Published: University of Newcastle Upon Tyne 2012
Subjects:
Online Access:http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.576774