Reconfigurable time interval measurement circuit incorporating a programmable gain time difference amplifier
As further advances are made in semiconductor manufacturing technology the performance of circuits is continuously increasing. Unfortunately, as the technology node descends deeper into the nanometre region, achieving the potential performance gain is becoming more of a challenge; due not only to th...
| Main Author: | |
|---|---|
| Published: |
University of Newcastle Upon Tyne
2013
|
| Subjects: | |
| Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.576783 |