Error resilient techniques for storage elements of low power design

Over two decades of research has led to numerous low-power design techniques being reported. Two popular techniques are supply voltage scaling and power gating. This thesis studies the impact of these two design techniques on the reliability of embedded processor registers and memory systems in the...

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Bibliographic Details
Main Author: Yang, Sheng
Other Authors: Al-Hashimi, Bashir
Published: University of Southampton 2013
Subjects:
Online Access:https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.577285