Time of flight mass spectrometry of pharmaceutical systems
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a widely used surface chemical analysis technique that is traditionally employed to characterise the first few molecular layers of a material interface. The ability of this technique to accurately reflect the surface chemistry of polymers,...
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University of Nottingham
2013
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| Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.594629 |