Preferred orientation modelling in high-pressure powder diffraction applied to structural studies of semiconductors
This thesis presents a new technique which makes use of the ability of area detectors, such as image-plates, to record simultaneously data from crystallites in many different orientations to model texture from samples under pressure. Experimental methods have been developed to allow data to be colle...
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University of Edinburgh
1994
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| Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.664045 |