The interaction of keV cluster and MeV ions with insulating materials
Secondary ion mass spectrometry (SIMS) is a well-known surface analysis technique with numerous applications in materials science. In recent years various types of primary ion beams have emerged to improve SIMS for analysing polymers, organic semiconductors and biological materials. keV cluster ions...
| Main Author: | |
|---|---|
| Other Authors: | |
| Published: |
University of Surrey
2015
|
| Subjects: | |
| Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.665283 |