The epitaxial growth and structure of metal overlayers on oriented substrates studied by surface X-ray diffraction
The growth mode and structure of metal overlayers, stabilised by molecular beam epitaxy, on oriented semiconductor and metal substrates, was investigated using surface x-ray diffraction and synchrotron radiation. The growth of the metastable fee phase of Fe on Cu(001) at 300 K followed a layer- by-l...
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University of Leicester
1995
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| Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.674425 |