Non contact atomic force microscopy investigation of silicon nanoparticles deposited on HOPG
The aim of this thesis was to further our understanding on the surface dynamics of silicon nanoparticles deposited on Highly Oriented Pyrolytic Graphite (HOPG) using non-contact Atomic Force Microscopy (NC-AFM) with the longer term aim of developing practical applications. Silicon nanoparticles in l...
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University of Leicester
2015
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| Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.677421 |