Growth and defect formation in graphene
In this work, few-layer graphene (FLG) was grown from SiC(0001) with temperature, growth time and cooling rate as variables. Samples were characterised by Scanning Tunnelling Microscopy (STM), Low Energy Electron Diraction (LEED), Auger Electron Spectroscopy (AES) and Raman Spectroscopy (RS) to dete...
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Durham University
2016
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| Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.685696 |