Express analysis of actual bluntness of AFM probe tips
The Atomic Force Microscope (AFM) is an invention that has enabled a significant number of studies and discoveries in the field of nanotechnology. It is well-known that the resolution of AFM-based applications is critically dependent on the tip bluntness of the probe utilised. Numerous researchers h...
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Cardiff University
2017
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| Online Access: | https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.723602 |