Electronic and structural properties of ultra-thin rare earth overlayers
Photoelectron spectroscopy, low energy electron diffraction (LEED), Auger electron spectroscopy (AES), secondary electron emission crystal current (SEECC) and work function change measurements have been used to correlate the electronic and geometric structures of well characterised overlayers of Tm...
| Main Author: | |
|---|---|
| Published: |
University of Leicester
1993
|
| Subjects: | |
| Online Access: | https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.737461 |