Atomic layer deposition of alumina and zinc oxide for optoelectronic devices

Atomic layer deposition (ALD) uses surface reactions of gaseous precursors to grow thin films of materials. Exceptional uniformity and thickness control is possible due to the separation of the different precursors, allowing each to undergo reactions with substrate surface groups until, on chemisorp...

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Bibliographic Details
Main Author: Burgess, Claire Hannah
Other Authors: McLachlan, Martyn ; Alford, Neil
Published: Imperial College London 2016
Online Access:https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.739607