Reliability of analogue circuits
The reliability of CMOS circuits has worsened due to technology scaling. From the review of previous work on reliability study for CMOS circuits, it has been found that both digital and analogue circuits were susceptible to single event effects. Single event effects although causing non-permanent er...
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University of Southampton
2018
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| Online Access: | https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.759251 |