Characterisation of half-metallic thin films using polarised neutron reflectometry
Half-metallic (HM) materials are promising candidates for spintronic devices due to their 100% spin polarisation at the Fermi level and their high TC, making them robust to thermal fluctuations. For HM to be used in devices, they need to be in thin film form and retain both SP and magnetisation thro...
| Main Author: | |
|---|---|
| Published: |
University of Warwick
2018
|
| Subjects: | |
| Online Access: | https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.759681 |