Cognitive Diagnostic Models-based Automatic Item Generation: Item Feature Exploration and Calibration Model Selection

Cognitive Diagnostic Models-based Automatic Item Generation: Item Feature Exploration and Calibration Model Selection

One of the most significant challenges for test developers is the creation and production of effective test items. Automatic Item Generation (AIG) presents a highly-efficient approach to developing items at a relatively low cost. Research is conducted on the AIG system to explore item characteristic...

Full description

Bibliographic Details
Main Author: Bai, Yu
Language:English
Published: 2019
Subjects:
Educational tests and measurements
Statistics
Psychometrics > Computer programs
Educational tests and measurements > Design and construction
Online Access:https://doi.org/10.7916/d8-53se-nt69

Internet

https://doi.org/10.7916/d8-53se-nt69

Similar Items