Test methodologies of VLSI circuits using scanning electron microscope.

Test methodologies of VLSI circuits using scanning electron microscope.

by Chan Lap-kong. === Thesis (M.Phil.)--Chinese University of Hong Kong, 1994. === Includes bibliographical references (leaves 77-80). === ABSTRACT === ACKNOWLEDGEMENTS === LIST OF FIGURES === Chapter 1. --- INTRODUCTION --- p.1 === Chapter 1.1 --- Background --- p.1 === Chapter 1.2 --- Problems i...

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Bibliographic Details
Other Authors: Chan, Lap-kong.
Format: Others
Language:English
Published: Chinese University of Hong Kong 1994
Subjects:
Integrated circuits > Very large scale integration > Testing
Scanning electron microscopy
Online Access:http://library.cuhk.edu.hk/record=b5888170
http://repository.lib.cuhk.edu.hk/en/item/cuhk-318218

Internet

http://library.cuhk.edu.hk/record=b5888170
http://repository.lib.cuhk.edu.hk/en/item/cuhk-318218

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