Electron microscopy characterisation of polycrystalline silicon carbide
This dissertation focuses on an electron microscopy investigation of the microstructure of SiC layers in TRISO coated particles deposited by chemical vapour deposition under different experimental conditions, which include temperature, concentration of gases and deposition time. The polycrystalline...
| Main Author: | |
|---|---|
| Format: | Others |
| Language: | English |
| Published: |
Nelson Mandela Metropolitan University
2014
|
| Subjects: | |
| Online Access: | http://hdl.handle.net/10948/d1020634 |