Single event upset testing of flash based field programmable gate arrays
In the last 50 years microelectronics have advanced at an exponential rate, causing microelectronic devices to shrink, have very low operating voltages and increased complexities; all this has made circuits more sensitive to various kinds of failures. These trends allowed soft errors, which up until...
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| Format: | Others |
| Language: | English |
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Nelson Mandela Metropolitan University
2015
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| Online Access: | http://hdl.handle.net/10948/12520 |