A CAD tool for the prediction of VLSI interconnect reliability.

A CAD tool for the prediction of VLSI interconnect reliability.

This thesis proposes a new approach to the design of reliable VLSI interconnects, based on predictive failure models embedded in a software tool for reliability analysis. A method for predicting the failure rate of complex integrated circuit interconnects subject to electromigration, is presented. T...

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Bibliographic Details
Main Author: Frost, David Frank.
Other Authors: Poole, K. F.
Language:en
Published: 2012
Subjects:
Integrated circuits > Very large scale integration.
Design and construction.
Computer-aided design.
Integrated circuits > Reliability.
Theses > Electronic engineering.
Online Access:http://hdl.handle.net/10413/6887

Internet

http://hdl.handle.net/10413/6887

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